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You can only improve
what you can measure

That is why we keep adding to what can be measured, and put our ultimate effort in providing the best in both sensitivity and reproducibility for automated material metrology, ex situ and in situ.

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Latest News and Events

2020.11.09: CS Live II Presentation

See the pesentation by Dr. Lacroix from our booth at the CS Live II conference in November 2020, entitled "Beyond the PL Mapper".

2020.03.29: CS International Conference

Come visit us in Brussels at the CS International Conference!

(Currently postponed due to COVID-19)

2019.02.14: New Wafer Mapping Products Lineup

YWafer2019 brings new products and featues to our already versatile wafer mapping product line YWafer Mapper.

YWAFER-GS3 has now been discontinued as 2 to 3 inch wafer mapping is supported by both our GS4 and RD8 models.  We will consider supplying GS3's only upon special requests or volume orders.  YWAFER-YB products have also merged with the GS and RD series as special configurations of those models.

The current models, separated by mapping area capacity and loading methods is now as follows:

  GS4 RD8 -WL26 -WL48
up to 4 inch mapping (100x100 mm) 
up to 8 inch mapping (200x200 mm)   
2 to 6 inch robotic wafer loading      
4 to 8 inch robotic wafer loading      
over 8 inch mapping or loading Available as special order

 For more detailed information on the various capabilities and configurations that will best suite your needs, please contact us.

2017.01.21: Taiwan Patent Granted

YSystems was awarded patent number I 567377 (APPARATUS AND METHOD FOR MEASURING A LUMINISCENT DECAY) by the Taiwan Patent office. 

2016.06.01: RobotShop Japan Co., Ltd. begins operation!

On June 1st, RobotShop Japan opened its online store of robotic products.  YSystems and RobotShop Inc. (Canada) joined forces to expand the world leading distributor to include Japan as a logistic center!

  • 1-3-4 HIgashi-Okinosu, Tokushima, Japan
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