Come visit us in Brussels at the CS International Conference from March 31 to April 1st 2020!
2019 brings new products and featues to our already versatile wafer mapping product line YWafer Mapper.
YWAFER-GS3 has now been discontinued as 2 to 3 inch wafer mapping is supported by both our GS4 and RD8 models. We will consider supplying GS3's only upon special requests or volume orders. YWAFER-YB products have also merged with the GS and RD series as special configurations of those models.
The current models, separated by mapping area capacity and loading methods is now as follows:
|up to 4 inch (100x100 mm) mapping||〇||〇||〇||〇||〇|
|up to 8 inch (200x200 mm) mapping||〇||〇||〇|
|2 to 4 inch robotic wafer loading||〇||〇|
|2 to 6 inch robotic wafer loading||〇|
|4 to 8 inch robotic wafer loading||〇|
|over 8 inch mapping or loading||Available as special order|
For more detailed information on the various capabilities and configurations that will best suite your needs, we will be more than happy to assist.
On June 1st, RobotShop Japan opened its online store of robotic products. YSystems and RobotShop Inc. (Canada) joined forces to expand the world leading distributor to include Japan as a logistic center!
The 6th International Symposium on Growth of III-Nitrides (ISGN-6) Young Scientist Award
Theme: Growth of InGaN well layer with an in-situ monitoring system
Title of Article： Evaluation of excess In during metal organic vapor-phase epitaxy growth of InGaN by monitoring via in situ laser scatterin
Name of Recipient: Mr. Tetsuya Yamamoto
ISGN-6 website: http://isgn6.jp/
Mr. Tetsuya Yamamoto, a student of Graduate School of Engineering at Nagoya University has received the Young Scientist Award from The 6th International Symposium on Growth of III-Nitrides (ISGN-6), which was held in Hamamatsu city on August 13th of 2015. The YSystems' YGrowthMonitor In Situ monitoring system (YGM) has been an essential tool to his research and contributed to his winning prize. Results show the potential of the YGM technology to enable the optimization of the growth conditions for In-rich InGaN.
A 200mm measurement area phosphor wafer mapping system, one configuration of our YWafer RD8 lines, has been shipped to the Toshiba Corporate Research & Development Center.
In order to obtain and map characteristics of these materials, our phosphorencence mapping systems (such as our smaller YB3 and YB4) implement a configuration such as used in typical phosphor-based light sources where blue light is partly transmitted from below the wafer, and yellow light is emitted from the absorbed portion. (Click here for more information on the measurement method)
One of our latest models in the YWafer GS4 family of wafer mappers, with a full range of enhanced functions for mapping of photoluminescence, was delivered to Sharp Corporation.
Based on sophisticated optical metrology, the GS4 is more than ever customizable, providing the user with the optimal tool for measuring and mapping GaN-based wafer and more. As its predecessors, the latest version of GS4 is designed to realize rapid, accurate, and highly reproducible measurement across a wide wavelength range and material systems. The GS4 can handle wafer sizes up to 100 x 100mm, and its built-in photoluminescence referencing technology enables the highest possible short and long term measurement stability and reproducibility.
Some possible extensions of the GS4 sysytem include up to 3 laser excitation sources, transmission and/or reflection sources and surface profiling for the measurement of epitaxial thickness, wafer curvature. For more information our mapping products, please follow this link!
One system of our latest wafer mapping product lines, YWafer-RD8, was recently delivered to Toyota Central R&D Labs., Inc. (TCRDL)
Featuring excitation control (for both spot size and attenuation) as well as extremely sensitive detection using both photo-diode and cooled CCD spectroscopy, such a system allows for weak defect band emission measurement over a range of intensities never achieved before.
According to scientists at TCRDL, "We are now able to measure and map the defect emission intensity of our wafers with high sensitivity, over more than 5 orders of magnitude, and moreover, wafer mapping with varying intensities of excitation can be achieved in a fully-automated fashion by using the RD8".
Since its first excimer laser photoluminescence excitation prototype in 2010, YSystems has been developping the ultimate deep ultra-violet (DUV) wafer mapping system for the emerging markets related to DUV-LEDs. Based on our stable YWafer-GS4 platform and an air-cooled compact excimer laser source, this is a necessary tool for laboratories and industry aiming to enter these markets. Deep ultra-violet emission and transparency of AlGaN-based epitaxy can now be measured and mapped rapidly and with high reproducibility. Highlights include:
• Spectral emission measurement from 196nm
• Manual loading for any shape wafer up to 100x100mm (or with up to 100 UPH robotic handler option for 2, 4 inch wafers)
• All integrated system requiring only electric power utility
• Efficient simultaneous measurements (PL, transmission, reflection, thickness, curvature)
• System integrated optical references, fixed optics and other design optimizations for high measurement reproducibility
GS4-DUV-DESK (Image. Details are subject to change without notice)
2014 Nobel prize recipent professor Amano's group will be presenting a paper on high Indium concentration crystal growth, and measurements obtained using YSystems' YGrowthMonitor In Situ monitoring tools at the 10th International Symposium on Semiconductor Light Emitting Diodes in Taiwan. Our patented diffuse reflection measurement techniques and the unprecedented sensitivity of the instrument enables the In SItu measurement of growth roughness caused by over-saturated indium concentrations. The understanding of these mechanisms is crucial in order to improve the efficiency of light emitting diodes beyond 525nm (green). The lower efficiency of GaN based green light emitting diodes is one of the most important obstacles remaining in order to realize high efficiency LED lighting using all 3 additive colours: red, blue and green.
New product announcement YWafer RD8, our latest in wafer mapping technology for samples up to 200mm x 200mm is in its final design stage and should be ready for delivery as early as February 2015. We are now taking orders. Detailed specifications are available upon request.
YGM-CRV-1D In Situ Wafer Curvature Monitoring Head
A customized version of YGrowthMonitor (YGM-CRV) for extreme wafer curvature was delivered to a corporation in Japan. Our in situ monitoring products continue to adapt to new needs, in order to provide solutions to an ever growing variety of temperature, stress and reproducibility issues in commercial crystal growth.
A new production wafer mapping system (YWafer Mapper GS4-WL) for LED fabrication now in operation in Shanghai, China. The system uses all the latest features including high-speed simultaneous mapping of the photoluminescence, epitaxial thickness and surface profile (curvature).
"A Researcher Starting a Business? Of Course!"
An article by Dr. Lacroix is featured in this month's OBUTSU (Magazine of the Applied Physics Society of Japan), encouraging young scientists to consider starting a business as a natural choice for their career. The article describes how YSystems started 13 years ago driven by the need to understand what goes on during semiconductor processes, then putting this understanding into a product. (In Japanese only) Link to article (PDF)
YSystems' R&D group will be presenting results of crystal growth monitoring using YGrowthMonitor (YGM) at the 2013 LED General Forum in Tokushima. The paper (in English) is available via this link
Latest high performance GS4 for blue LEDs to be installed at a new LED factory in China. This latest model features simultaneous measurements of eptitaxial thickness, photoluminescence and wafer curvature, a performance to this date only available by YSystems.
New product prototype for monitoring solar panel efficiency and electrical characteristics delivered to Anan Technical College in Tokushima Japan. The new product will feature long time monitoring of solar panels in operation, reporting details of the current-voltage characteristic and environmental conditions over periods of over 3 months.
YWafer YB system ships to a phosphor wafer maker in Japan.
New product announcement YWafer YB (Yellow/Blue) solid plate phosphor material mapping system. Please contact us for more detail.
Fully automatic wafer mapping system (YWafer GS4-WL) ships to an LED maker in Japan.
YSystems Kokusai Co., Ltd., introduces a new product, an in-situ crystal growth monitoring system.
Introducing YSystems Kokusai Co., Ltd., a new related company supplying some of our products worldwide: www.ysystems-kokusai.jp