2014 Nobel prize recipent professor Amano's group will be presenting a paper on high Indium concentration crystal growth, and measurements obtained using YSystems' YGrowthMonitor In Situ monitoring tools at the 10th International Symposium on Semiconductor Light Emitting Diodes in Taiwan.  Our patented diffuse reflection measurement techniques and the unprecedented sensitivity of the instrument enables the In SItu measurement of growth roughness caused by over-saturated indium concentrations.  The understanding of these mechanisms is crucial in order to improve the efficiency of light emitting diodes beyond 525nm (green).  The lower efficiency of GaN based green light emitting diodes is one of the most important obstacles remaining in order to realize high efficiency LED lighting using all 3 additive colours: red, blue and green.